Capacitance measuring apparatus and capacitance measuring...

Details Capacitance measuring apparatus and capacitance measuring... Capacitance measuring apparatus and capacitance measuring...

2007-08-09

2010-10-12

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S686000, C327S362000

Reexamination Certificate

active

07812619

ABSTRACT:
A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.

REFERENCES:
patent: 5014011 (1991-05-01), Colvin
patent: 5321363 (1994-06-01), Wakamatsu et al.
patent: 5321367 (1994-06-01), Koscica et al.
patent: 6242966 (2001-06-01), Shiotsuka
patent: 6683462 (2004-01-01), Shimizu
patent: 6731129 (2004-05-01), Belluomini et al.
patent: 2002-168893 (2002-06-01), None
Agilent Technologies Evaluation of Gate Oxides Using a Voltage Step Quasi-Static CV Method, Application Note 4156-10, 15 pps.

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