Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-07-19
2011-07-19
Tang, Minh N (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000, C324S678000
Reexamination Certificate
active
07982471
ABSTRACT:
A capacitance measurement system precharges first terminals (21-0 . . . 21-k . . .21-n) of a plurality of capacitors (25-0 . . . 25-k . . .25), respectively, of a CDAC (capacitor digital-to-analog converter) (23) included in a SAR (successive approximation register) converter (17) to a first voltage (VDD) and pre-charges a first terminal (3-j) of a capacitor (CSENj) to a second voltage (GND). The first terminals are coupled to the first terminal of the capacitor to redistribute charges therebetween so as to generate a first voltage on the first terminals and the first terminal of the capacitor, the first voltage being representative of a capacitance of the first capacitor (CSENj). A SAR converter converts the first voltage to a digital representation (DATA) of the capacitor. The capacitance can be a touch screen capacitance.
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Cormier, Jr. Ronald F.
Mueck Michael
Brady III Wade J.
Patti John J.
Tang Minh N
Telecky Jr Frederick J.
Texas Instruments Incorporated
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