Capacitance measurement probe

Details Capacitance measurement probe Capacitance measurement probe

1983-04-19

1984-11-13

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

G01R 2726

Patent

active

044828608

ABSTRACT:
An improved probe is provided for surface texture capacitive gauging. One embodiment of the probe comprises a sensor assembly with a thin, flexible dielectric having a conductive coating to provide an active sensor area and integral lead-in which is durable, flexible, and constant. In another embodiment, a bladder-like flexible dielectric contains a conductive media and the bladder is appropriately confined to define the active sensor area. The probe includes a mask to further define the active sensor area and to sense proper seating of the probe on the work surface to be gauged.

REFERENCES:
patent: 2543570 (1951-02-01), Eder
patent: 3710244 (1973-01-01), Rauchwerger

Affiliated with

Also associated with

Rating

Capacitance measurement probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Capacitance measurement probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitance measurement probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2363054