Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-02-19
1992-12-08
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324 96, 324158R, 324 731, 359246, 356364, G01R 2726, G01R 3128, G01J 400
Patent
active
051701278
ABSTRACT:
An unassembled simple matrix liquid crystal display (LCD) panel, with strips of highly-conductive material, is tested by extracting a two-dimensional image of the capacitance distribution across the surface of the panel under test (PUT) through illumination of a modulator placed adjacent the surface, such as an NCAP modulator or other liquid dispersed polymer-based device. The light modulator is disposed to allow longitudinal probing geometries such that a measurement of capacitance is developed across a gap between the surface of the panel under test and the opposing face of the modulator which causes a power modulation in the optical energy which can be observed through an area optical sensor (such as a camera) for use in directly produce a two-dimensional spatially-dependent power modulation image directly representative of the spatially corresponding capacitance state on the surface of the panel under test.
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Harvey Jack B.
Photon Dynamics, Inc.
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