Capacitance height gauge

Details Capacitance height gauge Capacitance height gauge

1990-08-07

1992-08-04

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

307300, 324662, G01B 714

Patent

active

051362503

ABSTRACT:
A capacitance-type height gage for measuring the distance between a test probe and a surface includes comparison circuitry for detecting the phase angle difference between the test probe signal and a reference signal. The reference signal having an adjustable phase angle. Phase angle comparison is achieved by multiplying the test probe signal with the reference signal and filtering the output. The filtered output is inversely proportional to the distance between the test probe and the surface. Compensation circuitry is included for cancelling stray capacitance.

REFERENCES:
patent: 3019897 (1962-02-01), Barber et al.
patent: 3408566 (1968-10-01), Norwich
patent: 4152641 (1979-05-01), Hughes et al.
patent: 4499640 (1985-02-01), Brenton et al.
patent: 4499767 (1985-02-01), Fathauer et al.
patent: 4545020 (1985-10-01), Brasfield
patent: 4676100 (1987-06-01), Eichberger
patent: 4677320 (1987-06-01), Hannington
patent: 4733235 (1988-03-01), Baer et al.
patent: 4743838 (1988-05-01), Eckerle
patent: 4806848 (1989-02-01), Demers
patent: 4888824 (1988-12-01), Andersen et al.
patent: 4944028 (1990-07-01), Iijima et al.
Inmac, 51st Ed., Apr. 1986 Complete Cross-Reference Catalog pp. 130-131.

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