Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-30
2006-05-30
Lee, Diane I. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C382S124000
Reexamination Certificate
active
07053633
ABSTRACT:
The object of the present invention is to provide a high-precision fingerprint sensor. In order to achieve this object, the fingerprint sensor of the present invention comprises a matrix portion in which capacitance detection circuits, which each output a detection signal corresponding to the capacitance formed between the capacitance detection circuit and a fingerprint, are arranged in the form of a matrix; and an amplification circuit for amplifying this detection signal. The amplification circuit functions as a signal source for outputting a detection signal to the capacitance detection circuit and is constituted such that the detection signal is transmitted from the amplification circuit to the low potential source line via the capacitance detection circuit.
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Hiroyuki Hara et al., “Low Temperature Polycrystalline Silicon TFT Fingerprint Sensor with Integrated Comparator Circuit”, IEEE, Sep. 21-23, 2004, pp. 403-406.
Ryuichi Hashido et al., “A Capacitive Fingerprint Sensor Chip Using Low-Temperature Poly-Si TFTs on a Glass Substrate and a Novel and Unique Sensing Method”, IEEE Journal of Solid-State Circuits, Feb. 2003, vol. 38, No. 2, pp. 274-280.
Kramskaya Marina
Lee Diane I.
Oliff & Berridg,e PLC
Seiko Epson Corporation
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