Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-03
2006-10-03
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07116116
ABSTRACT:
To provide a superior capacitance detecting device, a capacitance detecting device includes M row lines and N column lines that are arranged in a matrix, capacitance detecting elements provided at intersections therebetween, and power lines. The capacitance detecting element includes a signal detecting element and a signal amplifying element. The signal detecting element includes a capacitance detecting electrode, a capacitance detecting dielectric film, and a reference capacitor. The signal amplifying element is composed of a thin film semiconductor device having a gate electrode, a gate insulating film, and a semiconductor film, and an electrode of the reference capacitor is connected to the row line.
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Ebihara Hiroaki
Hara Hiroyuki
Miyasaka Mitsutoshi
Deb Anjan
Dole Timothy J.
Oliff & Berridg,e PLC
Seiko Epson Corporation
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