Capacitance and leakage test method and apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324158F, 324678, G01R 2726

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active

052026400

ABSTRACT:
Capacitance is measured using a system including a high voltage ramp monitor. A signal net is connected to ground by probes while a constant charging current is applied to the internal planes. A pure capacitive net will have a linear voltage rise proportional to capacitance, therefore its capacitance can be represented by ramp time. Leakage shorts will be detected by residual charge current measurements. The stimulus voltage is maintained for a fixed time after ramping to provide net to internal plane stress testing. Measured net capacitance is compared to nominal net capacitance for short/open detection.

REFERENCES:
patent: 3460032 (1969-08-01), Bennent
patent: 3652929 (1972-03-01), Cushman
patent: 3824459 (1974-07-01), Uchida
patent: 3855527 (1974-12-01), Masopust
patent: 3975680 (1976-08-01), Webb
patent: 4103225 (1978-07-01), Stephens
patent: 4320338 (1982-03-01), Morris
patent: 4342959 (1982-08-01), Skilling
patent: 4558274 (1985-12-01), Carusillo
patent: 4565966 (1986-01-01), Burr
patent: 4748401 (1988-05-01), Aldinger
patent: 4775830 (1988-10-01), Lyyra
patent: 4795966 (1989-01-01), Cook
patent: 4841240 (1989-06-01), Hsue et al.
patent: 4906939 (1990-03-01), Berrigan
patent: 5059897 (1991-10-01), Aton et al.
patent: 5059911 (1991-10-01), Huber
PCT WO 90/02340 International Application Published Under The Patent Cooperation Treaty, Mar. 8, 1990.
Bare Board Testing by William M. Hastie in Circuits Mfg. Magazine, Jan. 1982, pp. 36-48.
IBM Technical Disclosure Bulletin, vol. 24, No. 11B, Apr. 1982, pp. 5943-5944.

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