Cap at resistors of electrical test probe

Details Cap at resistors of electrical test probe Cap at resistors of electrical test probe

2007-11-13

2007-11-13

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

11018134

ABSTRACT:
A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.

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LeCroy WaveLink D600,D300, D200, High Bandwidth Probes Probing Solutions, 2003, 4 pages http://www.lecoln.com.tw/getfile/lecroy/Datasheet/WaveLink/WaveLink—DS.pdf, no month.
LeCroy Announces WaveLink Probe Family for Test of PCI Express, Serial ATA and other High Bandwidth Applications, 2003, 4 pages, http://www.lecroy.com/ProductPress/FY03/021903.asp, no month.

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