Cantilevers for a magnetically driven atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

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G01B 528

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058668055

ABSTRACT:
A force sensing cantilever for use in a scanning probe microscope has both a top side and a bottom side. From the bottom side extends a probe tip. The bottom side is coated with a thin film of a first material and the top side is coated with a thin film of a second material. The first and second materials may be the same or they may be different. The materials and thicknesses of the respective films are selected so as to create opposing forces to counter the tendency of such cantilevers to bend when a thin film is applied to only one side thereof.

REFERENCES:
patent: Re33387 (1990-10-01), Binnig
patent: Re34331 (1993-08-01), Elings et al.
patent: Re34489 (1993-12-01), Hansma et al.
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4422002 (1983-12-01), Binnig et al.
patent: 4520570 (1985-06-01), Bendnorz et al.
patent: 4668865 (1987-05-01), Gimzewski et al.
patent: 4724318 (1988-02-01), Binnig
patent: 4785177 (1988-11-01), Boecke
patent: 4800274 (1989-01-01), Hansma et al.
patent: 4806755 (1989-02-01), Duerig et al.
patent: 4823004 (1989-04-01), Kaiser et al.
patent: 4837435 (1989-06-01), Sakuhara et al.
patent: 4866271 (1989-09-01), Ono et al.
patent: 4868396 (1989-09-01), Lindsay
patent: 4871938 (1989-10-01), Elings et al.
patent: 4877957 (1989-10-01), Okada et al.
patent: 4889988 (1989-12-01), Elings et al.
patent: 4902892 (1990-02-01), Okayama et al.
patent: 4914293 (1990-04-01), Hayashi et al.
patent: 4924091 (1990-05-01), Hansma et al.
patent: 4935634 (1990-06-01), Hansma et al.
patent: 4947042 (1990-08-01), Nishioka et al.
patent: 4952857 (1990-08-01), West et al.
patent: 4954704 (1990-09-01), Elings et al.
patent: 4956817 (1990-09-01), West et al.
patent: 4962480 (1990-10-01), Ooumi et al.
patent: 4968390 (1990-11-01), Bard et al.
patent: 4968914 (1990-11-01), West et al.
patent: 4969978 (1990-11-01), Tomita et al.
patent: 4992659 (1991-02-01), Abraham et al.
patent: 4992728 (1991-02-01), McCord et al.
patent: 4999494 (1991-03-01), Elings
patent: 4999495 (1991-03-01), Miyata et al.
patent: 5003815 (1991-04-01), Martin et al.
patent: 5009111 (1991-04-01), West et al.
patent: 5017010 (1991-05-01), Mamin et al.
patent: 5018865 (1991-05-01), Ferrell et al.
patent: 5025658 (1991-06-01), Elings et al.
patent: 5047633 (1991-09-01), Finlan et al.
patent: 5051646 (1991-09-01), Elings et al.
patent: 5066858 (1991-11-01), Elings et al.
patent: 5077473 (1991-12-01), Elings et al.
patent: 5081390 (1992-01-01), Elings
patent: 5103095 (1992-04-01), Elings et al.
patent: 5107113 (1992-04-01), Robinson
patent: 5107114 (1992-04-01), Nishioka et al.
patent: 5117110 (1992-05-01), Yasutake
patent: 5120959 (1992-06-01), Tomita
patent: 5141319 (1992-08-01), Kajimura et al.
patent: 5142145 (1992-08-01), Yasutake
patent: 5144128 (1992-09-01), Hasegawa et al.
patent: 5144833 (1992-09-01), Amer et al.
patent: 5155361 (1992-10-01), Lindsay
patent: 5155715 (1992-10-01), Ueyema et al.
patent: 5157251 (1992-10-01), Albrecht et al.
patent: 5166516 (1992-11-01), Kajimura
patent: 5168159 (1992-12-01), Yagi
patent: 5189906 (1993-03-01), Elings et al.
patent: 5196713 (1993-03-01), Marshall
patent: 5198715 (1993-03-01), Elings et al.
patent: 5202004 (1993-04-01), Kwak et al.
patent: 5204531 (1993-04-01), Elings et al.
patent: 5206702 (1993-04-01), Kato et al.
patent: 5210410 (1993-05-01), Barrett
patent: 5224376 (1993-07-01), Elings et al.
patent: 5229606 (1993-07-01), Elings et al.
patent: 5231286 (1993-07-01), Kajimura et al.
patent: 5237859 (1993-08-01), Elings et al.
patent: 5253516 (1993-10-01), Elings et al.
patent: 5257024 (1993-10-01), West
patent: 5258107 (1993-11-01), Yoshida et al.
patent: 5260567 (1993-11-01), Kuroda et al.
patent: 5260622 (1993-11-01), West
patent: 5260824 (1993-11-01), Okada et al.
patent: 5262643 (1993-11-01), Hammond et al.
patent: 5266801 (1993-11-01), Elings et al.
patent: 5266896 (1993-11-01), Rugar et al.
patent: 5266897 (1993-11-01), Watanuki et al.
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5274230 (1993-12-01), Kajimura et al.
patent: 5276324 (1994-01-01), Ohtaki et al.
patent: 5280341 (1994-01-01), Nonnemacher et al.
patent: 5283437 (1994-02-01), Grescher et al.
patent: 5283442 (1994-02-01), Martin et al.
patent: 5286977 (1994-02-01), Yokoyama et al.
patent: 5289004 (1994-02-01), Okada et al.
patent: 5291775 (1994-03-01), Gamble et al.
patent: 5293042 (1994-03-01), Miyamoto
patent: 5294804 (1994-03-01), Kajimura
patent: 5296704 (1994-03-01), Mishima et al.
patent: 5298748 (1994-03-01), Kenny et al.
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5304924 (1994-04-01), Yamano et al.
patent: 5306919 (1994-04-01), Elings et al.
patent: 5307693 (1994-05-01), Griffith et al.
patent: 5308974 (1994-05-01), Elings et al.
patent: 5314254 (1994-05-01), Yashar et al.
patent: 5314829 (1994-05-01), Coles
patent: 5317153 (1994-05-01), Matshshiro et al.
patent: 5319960 (1994-06-01), Gamble et al.
patent: 5319977 (1994-06-01), Quate et al.
patent: 5321977 (1994-06-01), Clabes et al.
patent: 5323003 (1994-06-01), Shido et al.
patent: 5324935 (1994-06-01), Yasutake
patent: 5325010 (1994-06-01), Besoeke et al.
patent: 5329808 (1994-07-01), Elings et al.
patent: 5331589 (1994-07-01), Gambino et al.
patent: 5338932 (1994-08-01), Theodore et al.
patent: 5354985 (1994-10-01), Quate
patent: 5357105 (1994-10-01), Harp et al.
patent: 5360977 (1994-11-01), Onuki et al.
patent: 5381101 (1995-01-01), Bloom et al.
patent: 5383354 (1995-01-01), Doris et al.
patent: 5388452 (1995-02-01), Harp et al.
patent: 5438206 (1995-08-01), Yokoyama et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5468959 (1995-11-01), Tohda et al.
patent: 5469733 (1995-11-01), Yasue et al.
patent: 5481521 (1996-01-01), Washizawa et al.
patent: 5495109 (1996-02-01), Lindsay et al.
patent: 5497000 (1996-03-01), Tao et al.
patent: 5581083 (1996-12-01), Majumdar et al.
patent: 5594166 (1997-01-01), Itoh et al.
patent: 5670712 (1997-09-01), Cleveland et al.
Jung, P.S., et al., "Novel Stationary-Sample Atomic Force Microscope with Beam-Tracking Lens", Electronics Letters, Feb. 4, 1993, vol. 29, No. 3, pp. 264-265.
Joyce, Stephen, A., et al., "Mechanical Relaxation of Organic Monolayer Films Measured by Force Microscopy", Physical Review Letters, May 4, 1992, vol. 68, No. 18, pp. 2790-2793.
Binning, G., et al., "Single-tube three-dimensional scanner for tunneling microscopy", Review of Scientific Instruments, Aug. 1986, vol. 57, No. 8, pp. 1688-1689.
Drake, B., et al., "Imaging Cyrstals, Polymers, and Processes in Water with the Atomic Force Microscope", Science, vol. 243, pp. 1586-1589.
Sonnenfeld, Richard, et al., "Atomic-Resolution Microscopy in Water", Science, Apr. 11, 1986, vol. 232, pp. 211-213.
Davidson, P., et al., "A new symmetric scanning tunneling microscope design", Journal of Vacuum Science & Technology: Part A, Mar./Apr. 1988, No. 2, pp. 380-382.
Marti, O., et al., "Atomic force microscopy of liquid-covered surfaces: Atomic resolution images", Applied Physics Letters, Aug. 17, 1987, vol. 51, No. 7, pp. 484-486.
Kirk, M. D., et al., "Low-temperature atomic force microscopy", Review of Scientific Instruments, Jun. 1988, vol. 59, No. 6, pp. 833-835.
Sonnenfeld, Richard, et al., "Semiconductor topography in aqueous environments: Tunneling microscope of chemomechanically polished (001) GaAs", Applied Physics Letters, Jun. 15, 1987, vol. 50, No. 24, pp. 1742-1744.
Chalmers, S.A., et al., "Determination of tilted superlattice structure by atomic force microscopy", Applied Physics Letters, Dec. 11, 1989, vol. 55, No. 24, pp. 2491-2493.
West, Paul, et al., "Chemical applications of scanning tunneling microscopy", IBM Joint Research Development, Sep. 1986, vol. 30, No. 5, pp. 484490.
Kramar, John Adam, "Candicacy Report", May 21, 1985.
Mate, C. Mathew, et al., "Determination of Lubricant Film Thickness on a Particulate Disk Surface by Atomic Force Microscopy", IBM Research Division, Research Report.
Martin, Y., et al., "Atomic force microscope-force mapping and profiling on a sub 100-.ANG. scale", Journal of Applied Physics, May 15, 1987, vol. 61, No. 10, pp. 4723-4729.
Damaskin, B.B., et al., "The Ad

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