Cantilever with integrated deflection sensor

Measuring and testing – Surface and cutting edge testing – Roughness

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7351436, 73862634, 73862639, G01B 734

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active

057394253

ABSTRACT:
A cantilever for scanning probe microscopy and other force or deflection measurements is described. The cantilever includes at least one one integrated strain sensing element within a constriction section (62) . The cantilever is improved over known cantilevers by reducing the longitudinal extension of the constriction, such that its contribution to the total deflection of the cantilever is reduced. The design of the cantilever is further improved by applying a beam (63) with an essentially triangular cross section in either a vertical or a horizontal plane or both.

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