Cantilever unit and atomic force microscope, magnetic force micr

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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385 13, 250306, H01J 516

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active

052605671

ABSTRACT:
A cantilever unit comprises a cantilever for supporting a probe and a displacement amount detecting means, the displacement amount detecting means being integrated with the cantilever. An information processing apparatus comprises the cantilever unit and optionally an information recording medium stationed in close vicinity to the unit, wherein an information in the medium is reproduced at a signal on the basis of an displacement amount of the cantilever. An atomic force microscope and magnetic force microscope comprise the cantilever unit, respectively.

REFERENCES:
patent: 3837728 (1974-09-01), Logan et al.
patent: 4717255 (1988-01-01), Ulbers
patent: 4724318 (1988-02-01), Binnig
patent: 4744661 (1988-05-01), Ulbers et al.
patent: 4865453 (1989-09-01), Gidon et al.
patent: 4906840 (1990-03-01), Zdeblick et al.
patent: 4912822 (1990-04-01), Zdelblick et al.
patent: 4998016 (1991-03-01), Nose et al.
patent: 5091983 (1992-02-01), Lukosz
patent: 5141319 (1992-08-01), Kajimura et al.
patent: 5155715 (1992-10-01), Ueyama et al.
"Atomic Force Microscope" by G. Binnig et al.; Physical Review Letters; vol. 56, No. 9, Mar. 3, 1986 pp. 930-933 published by The American Physical Society.
"Compact Interferometric Force Sensor", IBM Technical Disclosure Bulletin, vol. 32, No. 2, Jul. 1, 1989, New York USA; pp. 416-417.
"Optical Atomic Force Sensor" IBM Technical Disclosure Bulletin, vol. 32, No. 3A, Aug. 1, 1989, New York USA; pp. 241-242.
"Scanning probe microscopy: Current status and future trends" by H. K. Wickramasinghe; Journal of Vacuum Science and Technology, Part A. vol. 8 No. 1, Jan. 1, 1990 New York USA; pp. 363-368.

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