Cantilever type probe, scanning tunnel microscope and informatio

Details Cantilever type probe, scanning tunnel microscope and informatio Cantilever type probe, scanning tunnel microscope and informatio

1992-11-20

1994-06-14

Levy, Stuart S.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Electrical modification or sensing of storage medium

250306, 250310, G11B 900

Patent

active

053216857

ABSTRACT:
A cantilever type probe comprising a piezoelectric bimorph cantilever containing a piezoelectric material provided between driving electrodes for driving a cantilever, a probe formed thereon and a drawing electrode for a probe provided along the surface where a probe is formed, wherein there is provided a shielding electrode for electrically isolating the probe and the drawing electrode from the driving electrodes.

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Review of Scientific Instruments, vol. 58, No. 8, Aug. 1, 1987, New York, pp. 1343-1348; B. L. Blackford et al.: "High Stability Bimorph Scanning Tunneling Microscope".
IEEE Electron Device Letters, vol. 10, No. 11, Nov. 1, 1989, New York, pp. 490-492; S. Akamine et al: "Microfabricated Scanning Tunneling Microscope".
Physical Review Letters, vol. 49, No. 1, Jul. 5, 1982, pp. 57-61; G. Binnig et al.: "Surface Studies By Scanning Tunneling Microscope".
Journal of Vacuum Science & Technology A, vol. 8, No. 1, Jan./Feb. 1990, pp. 317-318; T. R. Albrecht et al.: "Microfabrication of Integrated Scanning Tunneling Microscope".

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