Cantilever-type near-field probe for optical data storage...

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Radiation beam modification of or by storage medium

Reexamination Certificate

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Details

C216S002000, C359S237000, C369S127000

Reexamination Certificate

active

07606132

ABSTRACT:
Disclosed are a cantilever-type near-field probe capable of easily improving an optical throughput and being applied to a head of an optical data storage and a method of manufacturing the same. An oxide film is formed on a silicon substrate having dielectric films formed as a mask layer on upper and lower portions thereof, and a circular dielectric film formed on the upper mask layer and providing a function of a holder. A distal end of the probe has a parabolic structure by use of an effect of a bird's peak provided due to a difference of growth rate of the oxide film produced by the dielectric film, thereby forming the initial probe. After the dielectric film is removed from the initial probe, a bottom surface of the silicon substrate is removed, thereby providing the probe with the near-field aperture having a high throughput.

REFERENCES:
patent: 5844251 (1998-12-01), MacDonald et al.
patent: 5959957 (1999-09-01), Ikeda et al.
patent: 6979406 (2005-12-01), Song et al.

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