Electrolysis: processes – compositions used therein – and methods – Electrolytic coating – Depositing predominantly single metal or alloy coating on...
Reexamination Certificate
2007-05-08
2007-05-08
Arana, Louis M. (Department: 2859)
Electrolysis: processes, compositions used therein, and methods
Electrolytic coating
Depositing predominantly single metal or alloy coating on...
C205S118000
Reexamination Certificate
active
11119859
ABSTRACT:
The various embodiments discloses a cantilever probe comprising a first electrode and a second electrode engaged to a substrate and a branched cantilever wherein the cantilever comprises a nanostruture. Furthermore, the probe comprises a first arm of the cantilever engaged to the first electrode and a second arm of the cantilever engaged to the second electrode. Additionally, the cantilever probe comprises an electrical circuit coupled to the cantilever wherein the electrical circuit is capable of measuring a change in piezoresistance of the cantilever resulting from an atomic force and/or a magnetic force applied to the cantilever. Additionally, the invention discloses a method of performing atomic force microscopy, magnetic force microscopy, or magnetic resonance force microscopy. The nanostructures may comprise carbon or non-carbon materials. Additionally, the nanostructures may include nanotubes, nanowire, nanofibers and various other types of nanostructures.
REFERENCES:
patent: 6401526 (2002-06-01), Dai et al.
patent: 6528785 (2003-03-01), Nakayama et al.
patent: 6656712 (2003-12-01), Balavoine et al.
patent: 6706402 (2004-03-01), Rueckes et al.
patent: 6737939 (2004-05-01), Hoppe et al.
patent: 6755956 (2004-06-01), Lee et al.
patent: 2005/0034529 (2005-02-01), Tang et al.
patent: 2005/0176228 (2005-08-01), Fonash et al.
J. Li et al.,Highly-Ordered Carbon Nanotube Arrays for Electronics Applications, Applied Physics Letters, Jul. 19, 1999, vol. 75, No. 3, pp. 367-369.
W. Z. Li et al.,Large-Scale Synthesis of Aligned Carbon Nanotubes, Science, Dec. 6, 1996, vol. 274, pp. 1701-1703.
W. Z. Li et al.,Straight Carbon Nanontube Y Junctions, Applied Physics Letters, Sep. 17, 2001, vol. 79, No. 12, pp. 1879-1881.
Arana Louis M.
Dykeman David J.
Greenberg & Traurig, LLP
The Trustees of Boston College
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