Cam reference for inspection of contour images

Details Cam reference for inspection of contour images Cam reference for inspection of contour images

2007-05-15

2007-05-15

Desire, Gregory (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C356S237400, C356S237500, C356S394000, C382S146000, C382S151000, C382S218000, C382S286000

Reexamination Certificate

active

10168713

ABSTRACT:
This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection output, the analyzing including comparing the inspection output with a computer file reference identifying more than two different types of regions. A method for inspecting an electrical circuit inspection is also disclosed.

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