Cam actuated DIP test socket

Details Cam actuated DIP test socket Cam actuated DIP test socket

1981-03-19

1983-10-04

Abrams, Neil

Geometrical instruments

H01R 13193

Patent

active

044075553

ABSTRACT:
A DIP test socket is disclosed to provide a zero entry force receptacle for dual in-line packages. The receptacle comprises a transport block receiving a DIP package thereon, with rows of contact legs positioned to depend adjacent the sides of the transport block. A housing block is disclosed, loaded with dual parallel rows of contact members having upwardly directed spring finger portions receiving the transport block therebetween. The housing block is further adapted with camming means for influencing engagement between the DIP package contact legs and the contact spring finger portions as the transport block is inserted toward the housing block.

REFERENCES:
patent: 257794 (1882-05-01), Weitzel
patent: 3448345 (1969-06-01), Koehler, Jr. et al.
patent: 3525972 (1970-08-01), Asick et al.
patent: 3649950 (1972-03-01), Gluntz
patent: 3696323 (1972-10-01), Kinkaid et al.
patent: 3715662 (1973-02-01), Richelmann
patent: 3848222 (1974-11-01), Lightner
patent: 3883207 (1975-05-01), Tomkiewicz
patent: 4200349 (1980-04-01), Holland
IBM Bulletin, Evans, vol. 11, No. 11, p. 1443, 4-1969.

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