Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2007-08-03
2008-09-16
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C702S032000, C702S030000, C356S303000
Reexamination Certificate
active
07426446
ABSTRACT:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.
REFERENCES:
patent: 2631489 (1953-03-01), Golay
patent: 3151247 (1964-09-01), Auvermann
patent: 3563654 (1971-02-01), Vermande
patent: 3578980 (1971-05-01), Decker
patent: 3586442 (1971-06-01), Tripp
patent: 3639062 (1972-02-01), Girard
patent: 3640625 (1972-02-01), Ibbett
patent: 3720469 (1973-03-01), Harwit
patent: 3811777 (1974-05-01), Chance
patent: 3922092 (1975-11-01), van den Bosch
patent: 4007989 (1977-02-01), Wajda
patent: 4264205 (1981-04-01), Landa
patent: 4304491 (1981-12-01), Kraushaar et al.
patent: 4448529 (1984-05-01), Krause
patent: 4450459 (1984-05-01), Turner et al.
patent: 5024508 (1991-06-01), Horner
patent: 5090807 (1992-02-01), Tai
patent: 5121239 (1992-06-01), Post
patent: 5235461 (1993-08-01), Kirsch et al.
patent: 5325324 (1994-06-01), Rentzepis et al.
patent: 5483335 (1996-01-01), Tobias
patent: 5485268 (1996-01-01), Tobias
patent: 5504575 (1996-04-01), Stafford
patent: 5537303 (1996-07-01), Stacy
patent: 5579105 (1996-11-01), Belton et al.
patent: 5586442 (1996-12-01), Nicodemus
patent: 5592327 (1997-01-01), Gabl et al.
patent: 5686722 (1997-11-01), Dubois et al.
patent: 5691886 (1997-11-01), Stacy
patent: 5748308 (1998-05-01), Lindberg et al.
patent: 5991460 (1999-11-01), Mitchell
patent: 6011640 (2000-01-01), Hutton
patent: 6018402 (2000-01-01), Campbell et al.
patent: 6071748 (2000-06-01), Modlin et al.
patent: 6101034 (2000-08-01), Cox et al.
patent: 6128078 (2000-10-01), Fateley
patent: 6271917 (2001-08-01), Hagler
patent: 6388794 (2002-05-01), Hagler
patent: 6700661 (2004-03-01), Cadell et al.
patent: 6711503 (2004-03-01), Haaland
patent: 6762833 (2004-07-01), Hagler
patent: 6853923 (2005-02-01), Trygg et al.
patent: 6859275 (2005-02-01), Fateley et al.
patent: 6871169 (2005-03-01), Hazen et al.
patent: 6897952 (2005-05-01), Hagler
patent: 6982788 (2006-01-01), Hagler
patent: 6995840 (2006-02-01), Hagler
patent: 6999165 (2006-02-01), Hagler
patent: 2004/0021078 (2004-02-01), Hagler
patent: 672758 (1952-05-01), None
patent: WO 97/31245 (1997-08-01), None
patent: WO 00/00796 (2000-01-01), None
Golay, M., “Static Multislit Spectroscopy and Its Application to the Panoramic Display of Infrared Spectra,” Journal of the Optical Society of America, Jul. 1951, pp. 468-472, vol. 41, No. 7.
Golay, M., “Multi-Slip Spectrometry,” Journal of the Optical Society of America, Jun. 1949, pp. 437-444, vol. 39, No. 6.
Grainger, J. F. et al., “A Multiplex Grating Spectrometer,” Journal de Physique, Colloque C2, Mars-Avril 1967, pp. C2-44-C2-52, supplemental au No. 3-4, Tome 28.
International Search Report, PCT/US99/14446, Jan. 11, 2000, 7 pages.
International Search Report, PCT/US03/07369, Oct. 27, 2003, 6 pages.
Search Report mailed Oct. 21, 1999, PCT/US99/14446, 6 pages.
International Preliminary Examination Report, PCT/US99/14446, Sep. 14, 2000, 31 pages.
Written Opinion, PCT/US99/14446, 6 pages.
Written Opinion, PCT/US03/07369, Sep. 4, 2004, 4 pages.
International Search Report and Written Opinion, PCT/US05/22959, Aug. 1, 2006, 7 pages.
Aspectrics, Inc.
Fenwick & West LLP
Wachsman Hal D
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