Calibration sample for particle analyzers and method for making

Details Calibration sample for particle analyzers and method for making Calibration sample for particle analyzers and method for making

1998-04-02

2000-06-13

Raevis, Robert

Measuring and testing

Instrument proving or calibrating

Gas or liquid analyzer

G01N 1700

Patent

active

060734760

ABSTRACT:
A calibration sample for a particle analyzer comprises a deposition tube containing a known distribution of submicron size particles. The sample is produced using a microwave discharge in a microwave chamber to generate particles from a feedstock gas at subambient pressure, transporting the particles downstream from the microwave chamber and depositing them on the tube. The downstream tubing can then be removed, stored, transported and used as a calibration sample. In subsequent use, gas flowing through the tube entrains particles from the inner wall, producing a particle-laden gas whose particle size distribution and composition are identical to that produced originally--even after storage for months. The sample, requiring no special equipment, can be used at remote sites to prove-in and calibrate particle analyzers.

REFERENCES:
patent: 5123738 (1992-06-01), Yonemura
patent: 5178836 (1993-01-01), Kitamori et al.
patent: 5604295 (1997-02-01), Robinson
patent: 5644071 (1997-07-01), Wagner
patent: 5747667 (1998-05-01), Sadar
patent: 5918254 (1999-06-01), Bottiger et al.

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