Calibration reticle for measuring microscopes

Details Calibration reticle for measuring microscopes Calibration reticle for measuring microscopes

1975-10-02

1977-10-25

Corbin, John K.

33125A, 73 1R, G02B 2732

Patent

active

040553760

ABSTRACT:
A calibration reticle for measuring microscopes is disclosed in which a calibrated distance is established by calibration reference lines whose locations are defined by selected features of the calibration pattern. Preferably, the calibration reference lines are not physically manifest on the calibration reticle, except by the selected features which specify the locations of the calibration reference lines.

REFERENCES:
patent: 2457170 (1948-12-01), Mitchell
patent: 3068743 (1962-12-01), Dyson
patent: 3229103 (1966-01-01), Rautsch et al.
Gage, The Microscope, 15th Ed., Comstock Pub. Co., Ithaca, N.Y., 1932, pp. 295-301.

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