Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2005-02-08
2005-02-08
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C702S079000, C326S016000, C711S170000
Reexamination Certificate
active
06853938
ABSTRACT:
A method for calibration of memory circuits is provided that adjusts memory circuit output parameters based on data eye measurements. Data eye patterns from the memory circuit outputs are measured by the memory controller for different settings of the memory circuit output parameters. Memory circuit output parameters can be adjusted to settings that correspond to widest average data eye widths, highest average data eye heights, or other suitable criteria.
REFERENCES:
patent: 5751642 (1998-05-01), Yoo
patent: 5864506 (1999-01-01), Arcoleo et al.
patent: 6131073 (2000-10-01), Honda et al.
patent: 6163486 (2000-12-01), Miura
patent: 6188640 (2001-02-01), Aikawa et al.
patent: 6434081 (2002-08-01), Johnson et al.
patent: 6462591 (2002-10-01), Garrett, Jr. et al.
patent: 6484232 (2002-11-01), Olarig et al.
patent: 6549474 (2003-04-01), Liu
patent: 6570406 (2003-05-01), Tang et al.
patent: 6587804 (2003-07-01), Johnson et al.
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