Calibration of integrated circuit time constants

Details Calibration of integrated circuit time constants Calibration of integrated circuit time constants

2005-01-11

2005-01-11

Assouad, Patrick (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Circuit tuning

C324S601000, C324S711000, C327S344000, C327S337000

Reexamination Certificate

active

06842710

ABSTRACT:
A method and system for calibrating a time constant within an integrated circuit. A voltage storage element is charged, and the time required to achieve a reference voltage on the storage element is measured. The measured time is compared to a desired time. It necessary, an adjustable impedance is modified to change the charging time, and the cycle may be repeated until the charging time matches the desired time. In this novel manner, an actual RC time constant, as rendered in a particular integrated circuit, is measured and potentially adjusted to match a desired time constant. Advantageously, configuration information of the adjustable impedance may be communicated to other circuitry within the integrated circuit to enable such circuitry to implement the same RC time constant in analog signal processing. Consequently, embodiments of the present invention overcome incidences of wide tolerance in passive components implemented in integrated circuits. Beneficially, no external test equipment is required.

REFERENCES:
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patent: 6628163 (2003-09-01), Dathe et al.
patent: 6677814 (2004-01-01), Low et al.
patent: 20040000926 (2004-01-01), Ooshita
Durham et al., “Integrated Continuous-Time Balaned Filters for 16-bit DSP Interfaces”, IEEE, 1993.*
Durham et al., “Circuit Architectures for High Linearity Monolithic Continous-Time Filtering”, IEEE, 1992.*
Durham et al., “High-Linearity Continuous-Time Filter in 5-V VLSI CMOS”, IEEE, 1992.

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