Calibration of frequency monitors having dual etalon signals...

Details Calibration of frequency monitors having dual etalon signals... Calibration of frequency monitors having dual etalon signals...

2007-12-04

2010-10-12

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

C356S454000

Reexamination Certificate

active

07813886

ABSTRACT:
Improved calibration of a dual-etalon frequency monitor having x-y outputs is provided. An ellipse is fit to the (x,y) points from a set of calibration data. For each (x,y) point, an angle θ is determined. A linear fit of frequency to θ is provided. Differences between this linear fit and the determined values of θ are accounted for by including a spline fit to this difference in the calibration.

REFERENCES:
patent: 6178002 (2001-01-01), Mueller-Wirts
patent: 6331892 (2001-12-01), Green
patent: 6859284 (2005-02-01), Rella et al.
patent: 7420686 (2008-09-01), Tan
patent: 2007/0024860 (2007-02-01), Tobiason et al.
patent: 2007/0195328 (2007-08-01), Tan

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