Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Patent
1995-06-07
1996-12-10
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
324662, 324690, 324758, G01R 2726, G01R 3500
Patent
active
055834434
ABSTRACT:
A capacitance probe is used by a coordinate measuring machine or machine tool to determine distances from the probe to the workpiece surface at various points over the surface. The probe is calibrated by moving it along a line, which is skewed to the surface. During this movement, a plurality of values of the capacitance and the corresponding values of the actual distance moved along the line are recorded. A datum value for the movement along the skewed line is also determined, which corresponds to a position at which the probe would touch the surface. The probe is calibrated without needing separate independent measurements of the distance from the probe to the surface. The workpiece surface is scanned using the thus-calibrate probe, in which different calibration values are used at different points on the surface, in order to account for the local shape of the surface.
REFERENCES:
patent: 3400331 (1968-09-01), Harris et al.
patent: 3986109 (1976-10-01), Poduje
patent: 4067225 (1978-01-01), Dorman et al.
patent: 4130796 (1978-12-01), Shum
patent: 4153998 (1979-05-01), McMurtry
patent: 4190797 (1980-02-01), Lecklidek et al.
patent: 4498043 (1985-02-01), Heathcote et al.
patent: 4509266 (1985-04-01), Cusack
patent: 4539835 (1985-09-01), Shambroom et al.
patent: 4814691 (1989-03-01), Garbini et al.
patent: 4816744 (1989-03-01), Papurt et al.
patent: 4908574 (1990-03-01), Rhoades et al.
patent: 5021740 (1991-06-01), Sarr et al.
patent: 5189377 (1993-02-01), Rhoades et al.
patent: 5315259 (1994-05-01), Jostlein
W. K. Clothier et al.; The Guarded Sphere as a Gauging Electrode in Length Metrology; 1967, vol. 44, J. Sci. Instrum. (month unavailable).
C. D. Bugg et al.; Correcting Scanning Capacitance Microscope Images for the Effect of Surface Gradient; pp. 239-244, vol. 12, Oct. 1990, Precision Engineering.
Wentworth Labs, Microscan, Model SCP7000 Non Contact Surface Profiler for Wet Printed Resistors, Pastes and Ceramic Substrates (date unavailable).
Abbe et al., "A Brief Report on Non-Contact Gauging", Jun. 1975, pp. 16-20.
Knowles, "Capacitance Gauging: Survey of Recent Advances", Oct. 1988, pp. 14-22.
Bound David C.
McMurtry David R.
Thomas David K.
Brown Glenn W.
Renishaw plc
Wieder Kenneth A.
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