Calibration of an analogue probe

Details Calibration of an analogue probe Calibration of an analogue probe

2005-06-21

2005-06-21

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Sensor or transducer

C702S095000, C073S001810, C033S503000, C033S554000, C033S556000

Reexamination Certificate

active

06909983

ABSTRACT:
A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.

REFERENCES:
patent: 4523450 (1985-06-01), Herzog
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patent: 5125261 (1992-06-01), Powley
patent: 5501096 (1996-03-01), Stettner et al.
patent: 5895442 (1999-04-01), Arndt et al.
patent: 6434846 (2002-08-01), McMurtry et al.
patent: 1 551 218 (1979-08-01), None
patent: WO 00/25087 (2000-05-01), None

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