Calibration of a probe

Details Calibration of a probe Calibration of a probe

2006-06-06

2006-06-06

Williams, Hezron (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Displacement, motion, distance, or position

C073S001810, C033S501020, C033S501040, C033S503000, C033S504000, C702S094000, C702S095000, C702S104000, C702S150000, C702S155000, C702S157000

Reexamination Certificate

active

07055367

ABSTRACT:
A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.

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Caskey et al., “Results of the NIST National Ball Plate Round Robin”, Journal of Research of the National Institute of Standards and Technology, Jan.-Feb. 1997, vol. 102, No. 1, pp. 85-93.

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