Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2011-08-16
2011-08-16
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
C324S601000
Reexamination Certificate
active
08000919
ABSTRACT:
A method useful for the characterization of a fixture splits a partially symmetric THRU structure into portions which may then be mathematically removed from both ports of a 2-port measured structure, leaving only the desired device under test (DUT).
REFERENCES:
patent: 7545151 (2009-06-01), Martens et al.
patent: 2008/0258738 (2008-10-01), Martens et al.
patent: 2008/0278176 (2008-11-01), Hagerup et al.
patent: WO/2008/021885 (2008-02-01), None
Charioui Mohamed
Le Toan M
Lenihan Thomas F.
Tektronix Inc.
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