Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Patent
1997-12-12
1999-03-16
Barlow, John
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
371 1, 371 276, 702117, 702125, 324 731, 3241581, 324617, 368113, 368118, G01R 3128
Patent
active
058842365
ABSTRACT:
A calibration method is provided for an IC tester which performs testing of ICs in association with a computer having a storage. A calibration file corresponding to results of calibration is stored by the computer. At first, the IC tester loads correction information representing results of a previous calibration from the computer. Then, a value of time propagation delay (TPD) is measured with respect to a pin selected from among pins of an IC and is compared with the correction information. The IC tester corrects a delay time provided for the pin whose value of TPD differs from the correction information. Thereafter, the correction information is renewed using the corrected delay time, so that the renewed correction information is stored by the computer. Thus, the IC tester completes the calibration prior to the testing of the IC. By the way, the correction of the delay time is made if the measured value of TPD is substantially different from the correction information, or if a prescribed time has already elapsed after the previous calibration. In addition, the pins of the IC can be partitioned into blocks, so that the value of TPD is measured with respect to a pin belonging to each of the blocks. Because the calibration is performed with respect to the selected pins only, it is possible to reduce calibration time which is required before the testing of the IC.
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Ando Electric Co. Ltd.
Barlow John
Vo Hien
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