Calibration method and device for long range guided wave...

Details Calibration method and device for long range guided wave... Calibration method and device for long range guided wave...

2005-11-29

2005-11-29

Raevis, Robert (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Apparatus for measuring by use of vibration or apparatus for...

C073S001860

Reexamination Certificate

active

06968727

ABSTRACT:
The present invention is for a simple, reliable and inexpensive method to calibrate a defect signal to determine the size of a defect in a pipe. A first reflected signal is received from the test area of the pipe. After attaching a clamp, a second reflected signal is received from the test area of the pipe. If defects are in the test area, by appropriate calculations using the first reflected signal and the second reflected signal, the size of the defect can be determined.

REFERENCES:
patent: 4270389 (1981-06-01), Shiraiwa et al.
patent: 4393711 (1983-07-01), Lapides
patent: 4522064 (1985-06-01), McMillan
patent: 4545251 (1985-10-01), Uchida et al.
patent: 4660419 (1987-04-01), Derkacs et al.

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