Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Patent
1993-11-22
1995-11-14
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
324650, 324638, 324615, G01R 3500
Patent
active
054670217
ABSTRACT:
A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
REFERENCES:
patent: 3454906 (1969-07-01), Hyltin et al.
patent: 3559108 (1971-01-01), Seidel
patent: 4450419 (1984-05-01), Schwarzmann
patent: 4764740 (1988-08-01), Meyer
patent: 4780661 (1988-10-01), Bolomey
patent: 4816767 (1989-03-01), Cannon et al.
patent: 4839578 (1989-06-01), Roos
patent: 4939485 (1990-07-01), Eisenberg
patent: 4947130 (1990-08-01), Kitayoshi
patent: 5034708 (1991-07-01), Adamian et al.
patent: 5109204 (1992-04-01), Keefer
Rabinovich: "An Instrument for Calibrating & Tuning Waveguide Reflectometers" Telecommun. & Radio Engineering--Sep. 1973.
Cronson: "A Six-port Automatic Network Analyzer"--IEEE Trans on MW Theory and Techniques--Dec. 1977.
Engen: "The Multistate Two Port: An alternative transfer standard"--ARFIG Digest--Spring 1993.
Froelich, R., "Measurement of GaAs FET Noise Parameters", Watkins-Johnson Co., vol. 13, No. 6, Nov./Dec. 86, pp. 2-11.
Froelich, R., "Automated Tuning for Noise Parameter Measurements Using a Microwave Probe", Watkins-Johnson Co., Mar. 1989, pp. 83-96.
Adamian, V., "Stable Source Aids Automated Noise-Parameter Measurements", The Time and Measurement Notebook, Feb., 1988, pp. 51-58.
Rytting, D., "Advances in Microwave Error Correction Techniques", Hewlett-Packard, Jun. 1, 1987, pp. 1-39.
Curran, J., "TRL Calibration for Non-Coaxial Measurements", Hewlett-Packard. Dec. 1983.
Hewlett-Packard Product Note 8510-5A, "Specifying Calibration Standards for the HP 8510 Network Analyzer", Feb. 1, 1988.
Adamian Vahe A.
Falcinelli Michael T.
Phillips Peter V.
ATN Microwave, Inc.
Solis Jose M.
Wieder Kenneth A.
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