Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-08-21
2011-12-13
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S023000, C702S127000, C702S189000
Reexamination Certificate
active
08078427
ABSTRACT:
A data analysis method includes automatically generating a set of curve fits for a data set from a mass spectrometer. The set of curve fits includes a plurality of suggested curve fits, each associated with a curve fit equation type. For each suggested curve fit, a fit metric is generated that indicates how well the curve fit matches the data set. Thereafter, a user interface is displayed that includes a table of user selectable suggested curve fits for display. A default suggested curve fit having a highest fit metric is displayed. A user override selection may be received for displaying at least one of the suggested curve fits in the table. The set of suggested curve fits under consideration can be filtered to conform with user requirements.
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Kalmeyer Vadim
Tischler Marc
Agilent Technologie,s Inc.
Dunn Drew A
Henson Mi'schita'
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