Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2006-06-20
2006-06-20
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S601000, C324S606000, C333S174000
Reexamination Certificate
active
07064557
ABSTRACT:
A calibration circuit and method causes a cutoff frequency to match the design frequency of low pass filter by adjusting a capacitor array in the low pass filter.
REFERENCES:
patent: 3644835 (1972-02-01), Thompson
patent: 6496011 (2002-12-01), Kloeckner
patent: 6573811 (2003-06-01), Martin
patent: 2002/0190810 (2002-12-01), Nystrom et al.
patent: 2003/0042984 (2003-03-01), Shervin et al.
Pan Meng-An
Wu Stephen
Broadcom Corporation
Deb Anjan
Squire Sanders & Dempsey L.L.P.
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