Calibration-associated systems and methods

Details Calibration-associated systems and methods Calibration-associated systems and methods

2007-07-10

2007-07-10

Shingleton, Michael B. (Department: 2817)

Oscillators

Ring oscillators

C331S074000, C324S765010, C713S503000

Reexamination Certificate

active

10840850

ABSTRACT:
The present invention relates to test systems for testing integrated circuit devices and to calibration associated systems and methods. One embodiment of the invention provides an auto-calibration system. The system includes: a plurality of delay line elements (DLEs) adapted to be connected in a loop; a state machine coupled to the plurality of DLEs and operative to provide state data for the plurality of DLEs; a start oscillation signal receiving circuit coupled to the loop and operative to trigger the loop in response to receipt of a start oscillation signal; and a calibration circuit coupled to the loop and operative to acquire calibration data for the plurality of DLEs.

REFERENCES:
patent: 5799049 (1998-08-01), McFarland et al.
patent: 6073259 (2000-06-01), Muething et al.
patent: 6233205 (2001-05-01), Wells et al.
patent: 6522162 (2003-02-01), Griffin et al.
Holt “electronic Circuits Digital and Analog” John Wiley and Sons, Inc. copyright 1978 p. 264.
Toshiyuki Okayasu et al., “CMOS Circuit Technology for Precise GHz Timing Generator”IEEE: ITC International Test Conference, Paper 31.2, pp. 894-902 (2002).
Mark R. Barber, “Fundamental Timing Problems in Testing MOS VLSI on Modern ATE,”IEEE Design&Test. pp. 90-97 (Aug. 1984).
James A. Gasbarro et al., “Integrated Pin Electronics for VLSI Functional Testers,”IEEE Journal of Solid-State Circuits, vol. 24(2), pp. 331-337 (Apr. 1989).
James A. Gasbarro et al., “A Single-Chip, Functional Tester for VLSI Circuits,”IEEE International Solid State Circuits Conference, pp. 84-86 (Feb. 1990).
A. T. Sivaram, “Split Timing Mode (STM)—Answer to Dual Frequency Domain Testing,”IEEE ITC International Test Conference, Paper 6.1, pp. 140-147 (2001).
Robert Hägglund et al., “Tuning and Compensation of Temperature Effects in Analog Integrated Filters,” Department of Electrical Engineering, Linköping University (no date).

Affiliated with

Also associated with

Rating

Calibration-associated systems and methods does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Calibration-associated systems and methods, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibration-associated systems and methods will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3749639