Calibration apparatus, calibration method, testing...

Details Calibration apparatus, calibration method, testing... Calibration apparatus, calibration method, testing...

2006-04-20

2008-08-05

Barlow, Jr., John E (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Circuit tuning

C702S106000, C702S085000, C375S226000

Reexamination Certificate

active

07409307

ABSTRACT:
There is provided a calibration apparatus for calibrating a jitter measuring circuit for outputting a jitter measuring signal corresponding to a value of jitter contained in an input signal, having a signal inputting section for sequentially inputting the first input signal having first period and the second input signal having second period to the jitter measuring circuit and a gain calculating section for calculating a gain in the jitter measuring circuit based on the jitter measuring signals to be outputted out of the jitter measuring circuit respectively with respect to the first and second input signals.

REFERENCES:
patent: 2003/0202573 (2003-10-01), Yamaguchi et al.
patent: 2004/0062301 (2004-04-01), Yamaguchi et al.
patent: 2005/0031029 (2005-02-01), Yamaguchi et al.
patent: 7321852 (1995-12-01), None
patent: WO-2004031784 (2004-04-01), None
International Search Report issued in PCT/JP2007/058116 dated Jul. 10, 2007 (2 pages).

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