Optics: measuring and testing – By light interference
Reexamination Certificate
2006-07-18
2006-07-18
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
C356S491000
Reexamination Certificate
active
07079251
ABSTRACT:
A multi-channel imaging system is calibrated by measuring the geometric distortion in each sub-image, generating corresponding correction factors, and applying such factors to correct subsequent image data. In addition, intensity transfer-function arrays are measured at each pixel, and further used to correct for system and detector nonlinearities and nonuniformity between images. The procedure is repeated over a range of wavelengths to produce a complete set of correction coefficients and transfer functions. When the system is used for interferometric phase measurements, multiple measurements are preferably taken and a random phase offset in the reference path length is introduced at each measurement. The multiple phase data so derived are then averaged to reduce phase-dependent systematic measurement errors.
REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 4344707 (1982-08-01), Massie
patent: 4399356 (1983-08-01), Feinleib et al.
patent: 4575248 (1986-03-01), Horwitz et al.
patent: 4624569 (1986-11-01), Kwon
patent: 5589938 (1996-12-01), Deck
patent: 5663793 (1997-09-01), de Groot
patent: 5777741 (1998-07-01), Deck
patent: 5883717 (1999-03-01), DiMarzio et al.
patent: 5926283 (1999-07-01), Hopkins
patent: 5982497 (1999-11-01), Hopkins
patent: 6249289 (2001-06-01), Amaud et al.
patent: 6304330 (2001-10-01), Millerd et al.
L. G. Brown, “A Survey of Image Registration Techniques,” Columbia University, Computer Science Department Publication, New York, NY, 1991.
R. C. Gonzalez et al., Digital Image Processing, Addison-Wesley, Reading, MA, 1987.
J. Schmit et al., “Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry,” Applied Optics, vol. 34, p. 3610, Jul. 1995.
C. K. Hong et al., “Least-squares fitting of the phase map obtained in phase-shifting electronic speckle pattern interferometry,” Optics Letters, vol. 20, p. 931, Apr. 1995.
T. D. Upton et al., “Optical and electronic design of a calibrated multichannel electronic interferometer for quantitative flow visualization,” Appl. Opt. vol. 34, No. 25, 19.
C. Koliopoulos et al., “Simultaneous phase shift interferometer,” SPIE vol. 1531, pp. 119-127, 1991.
Schwider et al., Applied Optics, vol. 22, pp. 3421-3432, 1983).
Schmit et al., Applied Optics vol. 34, pp. 3610-3619, 1995.
M. F. Kuchel, “Advanced Interferometry at Carl Zeiss,” Proceedings of SPIE, vol. 1720, p. 452-456 (1992).
Brock Neal J.
Denneau, Jr. Larry
Millerd James E.
4D Technology Corporation
Detschel Marissa J.
Duran Antonio R.
Toatley , Jr. Gregory J.
LandOfFree
Calibration and error correction in multi-channel imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Calibration and error correction in multi-channel imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibration and error correction in multi-channel imaging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3610584