Calibrating device for adapting a measuring device for...

Details Calibrating device for adapting a measuring device for... Calibrating device for adapting a measuring device for...

2005-06-06

2009-06-23

Williams, Hezron (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Displacement, motion, distance, or position

Reexamination Certificate

active

07549314

ABSTRACT:
The invention relates to a calibrating device for adapting a measuring device for measuring the thickness of thin layers on an object to be measured, comprising a calibrating surface (12) having a flat upper side and a flat underside, which are provided at a distance with a predetermined thickness, characterized in that the calibrating surface (12) is arranged separate from at least one edge area (18) and the calibrating surface (12) is connected to the at least one edge area (18) via at least one transition area (14).

REFERENCES:
patent: 2862178 (1958-11-01), Moore
patent: 2901829 (1959-09-01), Lucas
patent: 4738131 (1988-04-01), Euverard
patent: 6529014 (2003-03-01), Nix
patent: 34 04 720 (1985-08-01), None
patent: 197 02 950 (1998-07-01), None
patent: 2 344 906 (1977-10-01), None

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