Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2005-05-10
2005-05-10
JeanPierre, Peguy (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000, C341S172000
Reexamination Certificate
active
06891486
ABSTRACT:
An on-chip calibration circuit which can dynamically (i.e., in operational environment) measure the capacitor mismatch in an ADC using sampling capacitors to sample an input signal and a feedback capacitor (in combination with an amplifier) for amplification. The measured values can be used to generate accurate digital codes representing analog signal samples. The calibration circuit connects the capacitors to various voltage levels and measures the mismatch levels by examining various signals (e.g., the digital codes) generated in such situations.
REFERENCES:
patent: 5510789 (1996-04-01), Lee
patent: 5825316 (1998-10-01), Kuttner
patent: 6169502 (2001-01-01), Johnson et al.
patent: 6184809 (2001-02-01), Yu
patent: 6489914 (2002-12-01), Jones et al.
Mishra Vineet
Pentakota Visvesvaraya A.
Venkataraman Jagannathan
Brady W. James
Jean-Pierre Peguy
Swayze, Jr. W. Daniel
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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