Calibrating automatic test equipment

Pulse or digital communications – Testing – Phase error or phase jitter

Reexamination Certificate

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Details

C375S224000, C375S225000, C370S229000, C370S234000, C714S700000, C714S741000

Reexamination Certificate

active

07957461

ABSTRACT:
Calibrating automatic test equipment (ATE) includes determining an offset between a reference timing event and a channel event, where the channel event is associated with a communication channel of the ATE, and adjusting signal transmission over the communication channel based on the offset. Determining the offset may include obtaining a first time at which a reference timing signal is received at a device associated with a reference timing source, obtaining a second time at which the reference timing signal is received at a device associated with the communication channel, obtaining a third time at which a channel signal is received at the device associated with the communication channel, obtaining a fourth time at which the channel signal is received at the device associated with the reference timing source, and calculating the offset using the first time, the second time, the third time, and the fourth time.

REFERENCES:
patent: 5526291 (1996-06-01), Lennen
patent: 5757677 (1998-05-01), Lennen
patent: 6275544 (2001-08-01), Aiello et al.
patent: 6492797 (2002-12-01), Maassen et al.
patent: 6566890 (2003-05-01), Hauptman
patent: 7120840 (2006-10-01), Shimanouchi
patent: 2002/0121904 (2002-09-01), Hauptman
patent: 2003/0234645 (2003-12-01), Iorga
patent: WO2006/107467 (2006-10-01), None
Thaler et al., “A Suite of Novel Digital ATE Timing Calibration Methods”, Proc. of the IEEE Int'l Test Conference on Discover the New World of Test and Design (Sep. 20-24, 1992). IEEE Computer Society, Washington, DC, pp. 520-529.
International Search Report and Written Opinion in corresponding Application No. PCT/US06/07186, dated Mar. 17, 2008.
International Preliminary Report on Patentability in Application No. PCT/US2006/007186, dated May 15, 2008.
Letter from Foreign Associate and Examination Report in Singapore Patent Application No. SG 200706761-4, dated Mar. 31, 2005.
Office Action in Chinese Application No. 200680011020.2, dated Feb. 12, 2010 and Letter from Foreign Associate regarding action.
English Translation of Action in Korean Application No. KR10-2007-7022426, dated Jul. 31, 2009.
Amendment & Argument to Second Office Action in Korean Application No. KR10-2007-7022426, filed Sep. 29, 2009.
Decision for a Patent Grant in Korean Application No. KR10-2007-7022426, dated Jan. 28, 2010.
Response to Written Opinion in Singapore Application No. 200706761-4, filed Jan. 30, 2009.
International Preliminary Report on Patentability in Application No. PCT/US2006/007186, dated Jul. 3, 2008.
Office action dated Jan. 31, 2009, English translation, and proposal for response in counterpart Korean patent application No. 10-2007-7022426, 12 pgs.
Letter from associate reporting First office action issued Feb. 12, 2010 in counterpart Chinese application No. 200680011020.2, 9 pgs.
Letter dated Jul. 26, 2010 from associate reporting response to telephonic notification from Examiner in counterpart Chinese application No. 200680011020.2, 5 pgs.
Letter from associate dated Jun. 25, 2010 reporting response to office action as filed in counterpart Chinese application No. 200680011020.2, 9 pgs.
Written Opinion issued Sep. 26, 2008 in counterpart Singapore application No. 200706761-4, 6 pgs.
Response to office action filed Nov. 25, 2010 in corresponding foreign Japanese application No. 2008-504061, 11 pgs, including English-language copy of amended claims.
Response to Written Opinion filed Jan. 30, 2009 in counterpart Singapore application No. 200706761-4, 6 pgs.
Letter from associate dated Sep. 9, 2010 reporting office action issued Aug. 27, 2010 in counterpart Japanese application No. 2008-504061, 5 pgs.
English translation of Office action issued Jan. 31, 2009 in counterpart Korean application No. 10-2007-7022426, 8 pgs.
Letter from associate dated Mar. 18, 2009 reporting response to office action as filed in counterpart Korean application No. 10-2007-7022426, 29 pgs.
English translation of Office action issued Jul. 31, 2009 in counterpart Korean application No. 10-2007-7022426, 6 pgs.
Letter from associate dated Sep. 29, 2009 reporting response to office action as filed in counterpart Korean application No. 10-2007-7022426, 17 pgs.

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