Calibrating a defect scan parameter for a disk drive

Details Calibrating a defect scan parameter for a disk drive Calibrating a defect scan parameter for a disk drive

2007-06-04

2010-02-02

Edun, Muhammad N. (Department: 2627)

Dynamic information storage or retrieval

Condition indicating, monitoring, or testing

Including radiation storage or retrieval

C369S053170, C369S047140, C369S044320

Reexamination Certificate

active

07656763

ABSTRACT:
A method is disclosed for performing a defect scan for a disk drive. Data is recorded on a first data area of a disk substantially free from defects and on a second data area of the disk substantially affected by at least one defect. A defect scan parameter is initialized with an initial setting. The first data area is read to determine a first defect threshold, and the second data area is read to determine a second defect threshold. A margin is saved representing a difference between the first and second defect thresholds. The setting for the defect scan parameter is adjusted, and the elements of reading the first and second data areas and saving a corresponding margin are repeated at least once. A setting is then selected for the defect scan parameter in response to the saved margins.

REFERENCES:
patent: 5195076 (1993-03-01), Aoki
patent: 5280395 (1994-01-01), Matsuzaki
patent: 6366081 (2002-04-01), Tan et al.
patent: 6504662 (2003-01-01), Sobey
patent: 6606211 (2003-08-01), Lim et al.
patent: 6731442 (2004-05-01), Jin et al.
patent: 6947232 (2005-09-01), Lim et al.
patent: 7072129 (2006-07-01), Cullen et al.
patent: 2004/0153949 (2004-08-01), Ro et al.
patent: 2005/0180282 (2005-08-01), Ouyang et al.

Affiliated with

Also associated with

Rating

Calibrating a defect scan parameter for a disk drive does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Calibrating a defect scan parameter for a disk drive, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibrating a defect scan parameter for a disk drive will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4233694