Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-12-18
1993-12-28
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324677, 324676, G01R 2726
Patent
active
052743349
ABSTRACT:
A circuit for measuring a parameter value by measuring the time required to charge a capacitor in a sensor RC circuit from a first to a second voltage includes a reference RC circuit whose capacitor is also charged between two voltage levels. The circuit is calibrated so that the time interval required to charge the reference capacitor may be used to improve the accuracy with which the parameter value is measured.
REFERENCES:
patent: Re33119 (1989-11-01), Baker
patent: 1758494 (1930-05-01), Behr
patent: 3542654 (1970-11-01), Orr
patent: 4379406 (1983-04-01), Bennewitz et al.
patent: 4404481 (1983-09-01), Ide et al.
patent: 4563634 (1986-01-01), Lehle
patent: 4621228 (1986-11-01), Toki et al.
patent: 4633168 (1986-12-01), Venema
patent: 4656599 (1987-04-01), Knothe et al.
patent: 4661768 (1987-04-01), Carusillo
patent: 4703886 (1987-11-01), Kirby
patent: 4706032 (1987-11-01), Allen et al.
patent: 4793187 (1988-12-01), Kordts
Harvey Jack B.
Honeywell Inc.
Schwarz Edward
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