Calibrated optical micrometer

Details Calibrated optical micrometer Calibrated optical micrometer

1977-01-06

1978-04-04

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

250224, G01B 1100

Patent

active

040824632

ABSTRACT:
A method and apparatus for calibrating an optical micrometer utilizes a precisely dimensioned grate which is temporarily introduced into the optical path of the instrument within its zone of measurement. A beam of light is scanned through the zone of measurement and across the grate, and the information obtained therefrom is recorded in an electronic memory. Thereafter, articles subsequently placed within the zone of measurement are scanned by the beam, and the information obtained therefrom is compared against the calibration data to provide an accurate measurement of the article.

REFERENCES:
patent: 3758214 (1973-09-01), Mangelsdorf
patent: 4043673 (1977-08-01), Harris et al.

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