Calibrated microwave dielectric coating thickness gauge

Details Calibrated microwave dielectric coating thickness gauge Calibrated microwave dielectric coating thickness gauge

1994-09-20

1996-07-23

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324642, 324645, 427 9, G01N 2200

Patent

active

055393225

ABSTRACT:
The present invention relates to a method and related apparatus for the nondestructive determination of n layers of coating of a target having n layers of dielectric coating applied to an electrically conductive base material, comprising; a generator of electromagnetic waves in the microwave frequency range, including a microwave oscillator, a waveguide attached to the oscillator output and having an output aperture, a voltage detecting diode disposed within the waveguide, a flat layer of material adapted to be placed in a position abutting the target and disposed over the aperture of the waveguide and having a thickness t which, together with the waveguide, will provide a fixed distance between the diode and the target, and a display responsive to the output of the detecting diode for indicating the layer characteristics of the dielectric coating on the electrically conductive base material.

REFERENCES:
patent: 3562642 (1971-02-01), Hochschild
patent: 4492915 (1985-01-01), Caspers
patent: 5012248 (1991-04-01), Munio et al.
patent: 5057781 (1991-10-01), Atkins et al.
patent: 5216372 (1993-06-01), Zoughi et al.

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