Measuring and testing – Display or display device details
Reexamination Certificate
2005-02-15
2005-02-15
Williams, Hezron (Department: 2856)
Measuring and testing
Display or display device details
C362S029000, C362S489000
Reexamination Certificate
active
06854350
ABSTRACT:
A custom instrument gauge module is disclosed which replaces the OEM instrument cluster gauges sub-assembly and utilizes the original electronic circuitry for the unique customization of an existing instrument cluster. The custom gauge module is designed and calibrated to replace the original cluster graphics, gauges, and pointers, while maintaining the original cluster circuitry and, optionally, the molded housing. The flexible design and manufacturing of the custom gauge module allows the enhancement of existing instrument panels to have an upgraded appearance and additional functions, while maintaining and using the original cluster complex electronic circuit.
REFERENCES:
patent: 5018087 (1991-05-01), Dannenberg
patent: 5672823 (1997-09-01), Lachmann et al.
patent: 6179429 (2001-01-01), Sheldon et al.
Bellamy Tamiko
Fildes & Outland, P.C.
Williams Hezron
LandOfFree
Calibrated custom instrument gauge module and means for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Calibrated custom instrument gauge module and means for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibrated custom instrument gauge module and means for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3443166