Calibrated custom instrument gauge module and means for...

Measuring and testing – Display or display device details

Reexamination Certificate

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Details

C362S029000, C362S489000

Reexamination Certificate

active

06854350

ABSTRACT:
A custom instrument gauge module is disclosed which replaces the OEM instrument cluster gauges sub-assembly and utilizes the original electronic circuitry for the unique customization of an existing instrument cluster. The custom gauge module is designed and calibrated to replace the original cluster graphics, gauges, and pointers, while maintaining the original cluster circuitry and, optionally, the molded housing. The flexible design and manufacturing of the custom gauge module allows the enhancement of existing instrument panels to have an upgraded appearance and additional functions, while maintaining and using the original cluster complex electronic circuit.

REFERENCES:
patent: 5018087 (1991-05-01), Dannenberg
patent: 5672823 (1997-09-01), Lachmann et al.
patent: 6179429 (2001-01-01), Sheldon et al.

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