Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-12-29
1991-08-13
Wieder, Kenneth A.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324617, 371 223, G01R 3100
Patent
active
050399390
ABSTRACT:
Chip performance is measured using LSSD logic to propagate a signal through the LSSD scan path of the chip. The measurement data is compared to tabular data which is used to classify the AC chip performance. The use of the LSSD scan path provides an accurate overall measurement of an entire chip. The circuitry is internal to the system and does not require external test circuitry. No unique test patterns are required for a given chip design. The chip measurements can be made after installation of the chip in a field operational environment as well as during a manufacturing and testing environment. The chip measurements can be made by local execution of the testing or controlled from a remote location.
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Dick Carroll J.
Ditmyer Bruce J.
Jeremiah Thomas L.
Jones Lawrence
Still Gregory S.
Burns William J.
International Business Machines - Corporation
Smith John C.
Wieder Kenneth A.
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