Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-01-17
2006-01-17
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S064000, C702S074000, C702S086000, C702S107000, C327S108000, C327S068000, C327S074000, C324S522000, C324S527000, C337S083000, C710S107000
Reexamination Certificate
active
06988044
ABSTRACT:
Disclosed herein is a method and system for calibrating line drive currents in systems that generate data signals by varying line drive currents and that interpret the data signals by comparing them to one or more reference voltages. The calibration includes varying the line drive current at a transmitting component. At different line drive currents, a receiver reference voltage is varied while the transmitting component transmits data to a receiving component. At each line drive current, the system records the highest and lowest receiver reference voltages at which data errors do not occur. The system then examines the recorded high and low receiver reference voltages to determine a desirable line drive current.
REFERENCES:
patent: 4173039 (1979-10-01), Sun et al.
patent: 5973516 (1999-10-01), Bremner et al.
patent: 6094075 (2000-07-01), Garrett et al.
patent: 6160851 (2000-12-01), Brown et al.
patent: 6294934 (2001-09-01), Garrett et al.
patent: 6301358 (2001-10-01), Chen et al.
patent: 6313670 (2001-11-01), Song et al.
patent: 6313776 (2001-11-01), Brown
patent: 6330194 (2001-12-01), Thomann et al.
patent: 6333639 (2001-12-01), Lee
patent: 2002/0050844 (2002-05-01), Lau et al.
patent: 2002/0087280 (2002-07-01), To et al.
Shen et al., ‘On-Chip Current Sensing Circuit for CMOS VLSI’, Jun. 1992, IEEE, pp. 309-314.
Schrift, ‘Digital BUS Faults Measuring Techniques’, Jan. 1998, IEEE, pp. 382-387.
Maxwell et al., ‘A Simulation-Based Method for Estimating Defect Free IDDQ’, Jan. 1997, IEEE, pp. 80-84.
Batra Pradeep
Rutkowski Rick A.
Assouad Patrick
Desta Elias
Lee & Hayes PLLC
Rambus Inc.
LandOfFree
Bus line current calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bus line current calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bus line current calibration will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3596060