Patent
1995-05-15
1997-02-11
Beausoliel, Jr., Robert W.
39518509, G06F 1100
Patent
active
056029896
ABSTRACT:
A testing method and apparatus for improving an efficiency of a post-production connectivity test of a bus coupling a semiconductor device to a bus connector each integrated on a system board. The method includes applying a special test fixture to the connector in lieu of a device designed to be operated by the particular bus. The test fixtures includes a plurality of memories having inputs and outputs connected to one of the conductors of the bus. By applying known patterns of signals to the memories and reading the outputs of the memories, connectivity of the bus is tested without operating the bus.
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Advanced Micro Devices , Inc.
Beausoliel, Jr. Robert W.
Palys Joseph E.
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