Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-12-25
2007-12-25
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11562294
ABSTRACT:
An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected testing temperature to be input by a user via a communications link to the controller. Each IC package has its testing temperature individually controlled by a controller. The module is easily attached and removed from an open-top socket through the use of latches on the testing socket. Many IC packages can be quickly placed and removed from testing sockets when a matrix of sensors and heaters (or coolers) are located on a single top attach plate with the sensors and heaters (or coolers) individually spring-loaded on the single top attach plate.
REFERENCES:
patent: 4940935 (1990-07-01), Riley
patent: 4962356 (1990-10-01), Eberlein et al.
patent: 5164661 (1992-11-01), Jones
patent: 5414370 (1995-05-01), Hashinaga et al.
patent: 5420521 (1995-05-01), Jones
patent: 5911897 (1999-06-01), Hamilton
patent: 6191599 (2001-02-01), Stevens
patent: 6230497 (2001-05-01), Morris et al.
patent: 6362640 (2002-03-01), Wee
patent: 6477047 (2002-11-01), Markwardt et al.
patent: 6636062 (2003-10-01), Gaasch et al.
patent: 6668570 (2003-12-01), Wall et al.
patent: 6981882 (2006-01-01), Palaniappa
patent: 7042240 (2006-05-01), Lopez et al.
patent: 7123037 (2006-10-01), Lopez
patent: 7187189 (2007-03-01), Lopez et al.
TEKMAR—Data Brochure, 10K Sensors, D070 Tekmar Control Systems, Ltd., Canada, pp. 1-4, Nov. 2001.
Denheyer Brian J.
Kuenster Gordon B.
Lopez Christopher A.
Hollington Jermele
Marger Johnson & McCollom PC
Wells-CTI, LLC
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