Burn-in test socket having spring-biased latches...

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C439S331000

Reexamination Certificate

active

07866987

ABSTRACT:
An electrical connector includes an insulative housing (1) defining a pair of guiding recesses (14), a connecting member (2) mounted in the insulative housing for connecting with a chip, a number of resilient members (4) received in the guiding recesses, a pair of latches (3) each having a pivot (34) mounted in the insulative housing and supported by the resilient members, and an actuator (3) mounted on the insulative housing and formed with a number of latching portions (63) in contact with the latch. The actuator is moveable along an up-to-down direction to drive the latch pivotable about the pivot between a locked position and an unlocked position.

REFERENCES:
patent: 6863553 (2005-03-01), Watanabe
patent: 7121858 (2006-10-01), Chen
patent: 7278868 (2007-10-01), Sato et al.
patent: 7393232 (2008-07-01), Morinari
patent: 7666016 (2010-02-01), Kobayashi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Burn-in test socket having spring-biased latches... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Burn-in test socket having spring-biased latches..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Burn-in test socket having spring-biased latches... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2679350

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.