Burn-in test apparatus

Details Burn-in test apparatus Burn-in test apparatus

2007-12-20

2011-10-18

Lau, Tung S (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

08041531

ABSTRACT:
A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.

REFERENCES:
patent: 7050342 (2006-05-01), Gans et al.
patent: 2005/0007172 (2005-01-01), Sadakata et al.
patent: 2007/0076495 (2007-04-01), Mochida et al.
patent: 10-0265138 (2000-06-01), None
patent: 10-2000-0065784 (2000-11-01), None
patent: 10-2005-0067493 (2005-07-01), None

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