Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-04-20
1998-08-25
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3500, G01R 3102
Patent
active
057986533
ABSTRACT:
A burn-in system for integrated circuits (ICs) generates thorough input stimuli from within the burn-in chamber. A very high node-toggle percentage within the IC being exercised is achieved, similar to that of a dynamic burn-in oven, even though the burn-in system of this invention has a cost and complexity similar to that of a static burn-in oven. This provides a cost-effective and reliable way to reduce the infant mortality of the ICs being exercised, or to estimate the longevity of the batch of ICs from which they came. The input-stimuli generator is based on a special-purpose burn-in controller IC. To better withstand the environmental stress within the burn-in chamber, the burn-in controller IC is fabricated using a robust IC technology, is operated at its nominal supply voltage and includes continuous fault tolerance features (such as self-test and/or voting). It is fully programmable to allow the same burn-in controller to be used with a variety of types of ICs being exercised. In accordance with another aspect of this invention, the input-stimuli generator loads instruction memory internal to the ICs being exercised with a self-exercise program and then waits while they execute this self-exercise program.
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Nguyen Vinh P.
Sun Microsystems Inc.
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